Selected Papers

• An Evaluation of the Minimal-MUMCUT Logic Criterion and Prime Path Coverage, Garrett Kaminski, Upsorn Praphamontripong, Paul Ammann, Jeff Offutt. The 2010 International Conference on Software Engineering Research and Practice, Las Vegas Nevada, USA. To appear. [Abstract]       [PDF]
• An Experimental Comparison of Four Unit Test Criteria: Mutation, Edge-Pair, All-uses and Prime Path Coverage, Nan Li, Upsorn Praphamontripong and Jeff Offutt. Fifth Workshop on Mutation Analysis (Mutation 2009), April 2009, Denver CO. [Abstract]       [PDF]
• Comparison of Unit-Level Automated Test Generation Tools., Shuang Wang and Jeff Offutt. Fifth Workshop on Mutation Analysis (Mutation 2009), April 2009, Denver CO. [Abstract]       [PDF]
• Testability of Dynamic Real-Time Systems: An Empirical Study of Constrained Execution Environment Implications, Birgitta Lindstrom, Jeff Offutt and Sten Andler. 1st IEEE International Conference on Software Testing, Verification and Validation (ICST 2008), pages 112-120, April 2008, Lillehammer, Norway. [Abstract]       [PDF]
• Generating Trace-Sets for Model-based Testing, Birgitta Lindstrom, Paul Pettersson and Jeff Offutt. 18th IEEE International Symposium on Software Reliability Engineering (ISSRE 2007), pages 171-180, November 2007, Trollhattan, Sweden. [Abstract]       [PDF]
• Automated Testing of Timeliness : A Case Study, Robert Nilsson and Jeff Offutt. Second Workshop on Automation of Software Test (AST 2007), May 2007, Minneapolis, MN, USA. [Abstract]       [PDF]
• Managing Conflicts When Using Combination Strategies to Test Software, Mats Grindal, Jeff Offutt and Jonas Mellin. Australian Software Engineering Conference ASWEC 2007, pages 255-264, April 2007, Melbourne, Australia. [Abstract]       [PDF]
• Conflict Management when Using Combination Strategies for Software Testing, Mats Grindal, Jeff Offutt and Jonas Mellin. Australian Software Engineering Conference ASWEC 2007, April 2007, Melbourne, Australia. [Abstract]       [PDF]
• Input Parameter Modeling for Combination Strategies, Mats Grindal and Jeff Offutt. IASTED International Conference on Software Engineering (SE 2007), February 2007, Innsbruck, Austria. [Abstract]       [PDF]
• On the Testing Maturity of Software Producing Organizations, Mats Grindal, Jeff Offutt and Jonas Mellin. Testing: Academia & Industry Conference - Practice And Research Techniques, TAIC PART 2006, August 2006 Windsor, UK. [Abstract]       [PDF]
• An Industrial Case Study of Structural Testing Applied to Safety-critical Embedded Software, Jing Guan, Jeff Offutt and Paul Ammann. International Symposium on Empirical Software Engineering, ISESE 2006, September 2006, Rio de Janeiro, Brazil. [Abstract]       [PDF]
• Test Case Generation for Testing of Timeliness, Robert Nilsson, Jeff Offutt and Jonas Mellin. Second Workshop on Model Based Testing, March 2006 Vienna, Austria. [Abstract]       [PDF]
• An Evaluation of Combination Testing Strategies, Mats Grindal, Birgitta Lindström, Jeff Offutt, and Sten F. Andler. Empirical Software Engineering, 11(4):583-611, December 2006. [Abstract]       [PDF]
• Input Validation Analysis and Testing, Jane Hayes and Jeff Offutt. Empirical Software Engineering, 11(4):493-522, December 2006. [Abstract]       [PDF]
• Combination Testing Strategies: A Survey, Mats Grindal, Jeff Offutt and Sten F. Andler. Journal of Software Testing, Verification and Reliability, 15(2):97-133, September 2005. [Abstract]       [PDF]
• Mutation-based Testing Criteria for Timeliness, Robert Nilsson, Jeff Offutt and Sten F. Andler. 28th Annual International Computer Software and Applications Conference (COMPSAC 2004). September 2004, pages 306-312, Hong Kong. [Abstract]       [PDF]
• Coverage Criteria for Logical Expressions, Paul Ammann, Jeff Offutt and Hong Huang. 2003 International Symposium on Software Reliability Engineering (ISSRE '03 ). pages 99-107, Denver, CO, November 2003. [Abstract]       [PDF]
• An Approach to Fault Modeling and Fault Seeding using the Program Dependence Graph, Mary Jean Harrold, Jeff Offutt, and Kanupriya Tewary. The Journal of Systems and Software, 36(3):273–296, March 1997. [Abstract]       [PDF]
• An Experimental Evaluation of Data Flow and Mutation Testing, Jeff Offutt, Jie Pan, Tong Zhang, and Kanupriya Tewary. Software Practice and Experience, 26(2): 165-176, February, 1996. [Abstract]       [PDF]
• A Semantic Model of Program Faults, Jeff Offutt and Jane Hayes. International Symposium on Software Testing and Analysis (ISSTA 96), San Diego, CA, January 1996. [Abstract]       [PDF]
• Procedures for Reducing the Size of Coverage-based Test Sets, Jeff Offutt, Jie Pan, and Jeffrey M. Voas. Twelfth International Conference on Testing Computer Software, pages 111-123, Washington, DC, June 1995. [Abstract]       [PDF]
• Estimation and Enhancement of Real-Time Software Reliability through Mutation Analysis, Robert Geist, Jeff Offutt, and Fred Harris. IEEE Transactions on Computers, Special Issue on Fault-Tolerant Computing, 41(5):550-558, May 1992. [Abstract]       [PDF]

Other links

• Co-authors: Robert Geist, Jie Pan.

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